Table of Contents
APSC 784 — Imaging Methods
W&M Catalog Entry
Semester: Fall (3 credits)
Prerequisite: permission by instructor
Fundamentals and applications of two complementary families of microscopy techniques: optical microscopy and scanning probe methods. Topics covered include geometric and wave optics, optical imaging, basic forms of light–matter interaction, all major optical microscopy modes (including fluorescence and confocal), interfacial forces, atomic force microscopy, scanning tunneling microscopy, and near-field optics.
This course currently consists of 55% optical microscopy and 45% scanning probe microscopy (mostly atomic force microscopy).
This class makes use of e-leaning methods significantly. A full set of pre-recorded lectures (30 hours) is available for download as a video web stream, simultaneously showing the instructor and the slides or virtual blackboard. Meetings in class room will put more emphasis on solving problems, discussing applications and questions, etc. In addition, a dedicated online discussion forum is used to communicate in a networked fashion and to further discuss problems and questions.
Office hours: Scheduled on a per-need basis for issues not addressed via online discussion forum
A — Optical Microscopy
A-00) Motivation + Information
A-01) Ray Optics Basics
A-02) Vision and Color
A-03) Real Systems
A-04) Wave Math
A-05) Wave Optics
A-06) Beam Optics
A-07) Fourier Optics
A-08) Microscope Anatomy
A-09) Light-Matter Interactions
A-10) Fluorescence (optional)
A-11) Electromagnetic Optics (optional)
A-12) DIC and Phase Contrast (optional)
B — Scanning Probe Microscopy
B-01) Scanning Tunneling Microscopy
B-02) SPM Components
B-03) Atomic Force Microscopy
B-04) Dynamic-mode AFM
B-05) Electric and Magnetic AFM Modes
B-06) Force spectroscopy
Eaton, P. J. and West, P., 2010. Atomic force microscopy. Oxford University Press, Oxford; New York.
Hecht, E., 2001. Optics (4th Edition). Addison-Wesley.
Saleh, B. E. A. and Teich, M. C., 2007. Fundamentals of Photonics. Wiley-Interscience, New York.
Tsukruk, V. V. and Singamaneni, S., 2011. Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices. Wiley-VCH, Weinheim (Germany).
Wayne, R., 2009. Light and video microscopy. Academic Press/Elsevier, Amsterdam; Boston.
Will be taught again in..
- Fall 2018
- Fall 2017
- Fall 2016
- Fall 2015
- Fall 2014 (as independent study class based on pre-recorded video streams)
- Fall 2013
- Spring 2012
- Spring 2011
- Spring 2010
- Spring 2009 (taught as a pilot class APSC 695–10, “Optical and Scanning Probe Microscopies”“)