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Our Scanning Probe Microscopes
NT-MDT NTEGRA Scanning Probe Laboratory
One of the two scanning probe microscopes (SPM) in Prof. Schniepp’s laboratory is the NT-MDT NTEGRA Prima Scanning Probe Laboratory (see Figure 3, left). NT-MDT is the second-largest manufacturer of SPMs in the world, and the oldest SPM brand in business. Their NTEGRA platform is arguably the most versatile, flexible and modular commercial scanning probe microscopy system on the market and is the only research-grade commercial instrument that allows to perform both sample-scanning and probe-scanning type experiments.
The configuration of this system installed in Prof. Schniepp's labs goes far beyond standard configurations of atomic force microscopes. It is equipped with four different piezo scanners that allow open- and closed-loop operation and cover scanning ranges from atomic resolutions to 100 microns. Scanning tunneling microscopy (STM) are supported as well as all static and dynamic imaging modes of atomic force microscopy (AFM), including contact mode, friction/lateral force microscopy (FFM/LFM), force-volume mode, force modulation microscopy (FMM), tapping mode (TM), true non-contact mode, phase imaging, scanning capacitance microscopy, scanning spreading resistance microscopy (SSRN), conductive AFM (C-AFM), Kelvin probe force microscopy (KPFM), electrostatic force microscopy (EFM), magnetic force microscopy (MFM), AFM lithography. It is currently the only commercial instrument on the market supporting atomic force acoustic microscopy (AFAM).
An electric break-out box providing access to all important electronic signals of the AFM is available. The instrument has two liquid cells suitable for different liquid amounts and different sample sizes to carry out high-resolution imaging and force spectroscopy in different solvents. Both liquid cells can be operated open and closed, allowing for fluid exchange during the experiment. The system is mounted on a custom-built anti-vibration system in the ultra-low noise basement laboratory. The noise level in all three spatial dimensions is on the order of 0.1 nm or below; the instrument routinely achieves atomic lattice resolution in air and in solvents. The system is further equipped with an enclosure that allows operation in low-vacuum or under controlled atmospheres.
We have a second state-of-the-art scanning probe microscope, the Bruker MultiMode 5 with a NanoScope IIId controller (see Figure 3, right). Bruker is the leading manufacturer for scanning probe microscopes with the largest install base. The MultiMode is their flagship small-sample product with highest resolution. It is also the most published atomic force microscope.
Our system is configured for liquid cell operation. Standard imaging modes include contact mode, tapping mode phase imaging, lateral force microscopy (LFM), and force modulation microscopy (FMM).